Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM), Park Systems NX10, is one of the first 100% automated flexure based scanning systems that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes. Various Measuring modes, Contact AFM in air/liquid; Semi-contact AFM in air/liquid; Non-contact AFM; Phase Imaging; Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy); Electric Force Microscopy (EFM); Piezo Response Force Microscopy; Force curve measurements; Nanolithography; Conductive AFM; Scanning Tunneling Microscopy STM; Photocurrent Mapping; Volt-ampere characteristic measurements.


Atomic Force Microscope NX10, Park Systems