Scanning Electron Microscopy (FE-SEM)

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Field-Emission Scanning Electron Microscope (FE-SEM), Supra55 Zeiss, provides excellent imaging properties combined with analytical capabilities makes this high end FE-SEM suitable for a wide range of applications in materials science, life science and semiconductor technology. The large specimen chamber for the integration of optional detectors and accessories enables the user to configure the SUPRA for specific applications without sacrificing productivity or efficiency.